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Semiconductor Equipment Components -JiFeng Ceramics

Ceramic Structural Components/

Semiconductor Equipment Components

Semiconductor Equipment Components are manufactured from high-purity ceramics (Al₂O₃/AlN/SiC/Si₃N₄/ZrO₂) or special alloys (Invar/AlSiC) via precision machining and surface treatment. They meet the strict requirements of semiconductor manufacturing for cleanliness, corrosion resistance, and thermal stability, and are widely used in wafer handling, etching, deposition, lithography, and testing equipment.

  • Product Details
  • Technical Specifications

Core Advantages Of Ceramic Semiconductor Equipment Components

Nanometer‑Level Precision

Flatness ≤0.005mm, surface roughness Ra≤0.1μm, ideal for wafer transfer & lithography alignment.

Extreme Environment Resistance

Operating temp 800–1600°C; plasma & acid/alkali resistant (pH 1–14); service life ×5+ vs metal.

Ultra-High Cleanliness

Metal ion leaching ≤1ppm; no particle shedding (NAS 1638 Class 1); EUV & high-purity process compatible.

Excellent Thermal Management

AlN thermal conductivity ≥170W/m·K; CTE matches silicon (4.5×10⁻⁶/℃), reduces thermal stress.

Typical Applications & Material Selection

1. Wafer Transport & Support

Wafer Chuck

Materials: Alumina (Al₂O₃, purity ≥99.5%) or Silicon Carbide (SiC, purity ≥99.9%).
Performance: Electrostatic adsorption force ≥0.1MPa, flatness ≤0.003mm, compatible with thinning and bonding of 12-inch wafers.

Vacuum Chamber Flange

Material: Aluminum Nitride (AlN, thermal conductivity ≥170W/m·K).
Performance: Gas tightness ≤1×10⁻⁹ Pa·m³/s, suitable for etching and PVD equipment.

2. Gas Distribution & Reaction Control

Gas Distribution Plate

Material: Yttria-Stabilized Zirconia (YSZ), resistant to plasma erosion.
Performance: Micropore diameter tolerance ±0.005mm, uniformity error ±2%.

Heater Base

Material: Silicon Carbide (SiC), temperature resistance up to 1600°C.
Performance: Resistance uniformity ≤±1%, designed for MOCVD epitaxial growth.

3. Lithography & Inspection Equipment

EUV Optical Lens Base

Material: Low-expansion Invar Alloy, CTE ≤1×10⁻⁶/°C.
Performance: Thermal stability ±0.01μm/°C, compatible with processes below 7nm.

Wafer Alignment Stage

Material: Lightweight AlSiC ceramic composite.
Performance: Repeat positioning accuracy ±10nm, matches lithography focusing systems.

Why Partner with JiFeng Ceramics?

Material Selection

Alumina / Aluminum Nitride / Silicon Carbide / Special Alloys, compatible with diverse semiconductor process requirements.

Process Optimization

Precision grinding (tolerance ±0.001mm) and CVD coating for superior wear and plasma resistance.

Functional Integration

Embedded electrodes and sensors, matching intelligent temperature control and real-time monitoring systems.

Cost Advantage

Adopts domestic high-purity powder and machining technologies, with prices 30%–50% lower than imported brands.

ItemDetails
Ceramic MaterialsSi₃N₄, Al₂O₃, ZrO₂, AlN, SiC
Machining Accuracy±0.01mm; Flatness 0.003mm; Parallelism 0.005mm
Key PropertiesWear-resistant, high temp resistant, high hardness, insulation, anti-corrosion
ColorsWhite, beige, black
CustomizationCustomizable per customer drawing

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